[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...

Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

Eight New Models Offer Biggest Display Size, Deepest Memory and the Only Pattern Generation Available in a Fixed Configuration PALO ALTO, Calif.—Agilent Technologies Inc. expands its industry-leading ...

Mountain View, CA. Synopsys Inc. on Tuesday announced its next-generation ATPG and diagnostics solution, TetraMAX II, incorporating the innovative test engines unveiled at the International Test ...

The picture on a TV set used to be the combined product of multiple analog systems, and since TVs had no internal diagnostics, the only way to know things were adjusted properly was to see for ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.